The 51^st International Field
Emission Symposium

June 29 – July 4, 2008 – Rouen, France

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Program

Timetable

Key dates

Conference Venue

Conference Fees

Abstract submission

Paper submission

Registration

Invited speakers

Accomodation

Location

Outstanding Young Scientist Award

Pre-meeting school - Sunday 29 June

Sponsors

Committees & Secretariat

Photos Galery

Conference Chairman : A. Menand
Co-chairmen : B. Deconihout and P. Pareige

Scope of the conference

The aim of the 51^st International Field Emission Symposium (51^st IFES) is to gather scientists from the field emission, nanoscience, atom probe and laser-matter interaction communities. The conference will cover various topics, including fundamental physics, simulation, instrumentation and advanced technological applications:

High Field Physics and Nanoscience
- Field ion emission
- Field electron emission
- Liquid metal ion sources
- Laser-matter interaction
- Near field microscopy
- Trajectories of charged particles
- Ultra-fast related phenomena

Atom probe Tomography
- Instrumentation and related physics
- Atom probe specimen preparation
- 3D data mining
- 3D image reconstruction
- Nano-analysis of Metallic alloys
- Analysis of micro-electronic materials
- Nanostructured materials - nanosciences

The program will include plenary sessions with keynote lectures given by international experts, parallel sessions for oral presentations, poster sessions and also workshops for intensive discussions and exchange of ideas.

 

 

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Pictures of Rouen courtesy of C. Singh