The 51st International Field
Emission Symposium

June 29 – July 4, 2008 – Rouen, France

 

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Pre-meeting school - Sunday 29 June

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Pre-meeting school
Sunday 29 June (10 am - 6 pm)

Organized by :
E. Marquis (University of Oxford)
F. Vurpillot (University of Rouen)

A one-day school on atom probe tomography that will be held on the Sunday preceding the International Field Emission Symposium, June 29, 2008.

This day of lectures will provide a thorough background on the principles of the atom probe technique, data reconstruction, evaporation artefacts, and data mining through the presentation of many examples taken from metallurgical as well as semiconductor applications.

The International Field Emission Society organises a pre-conference school devoted on to the technique of Atom probe Tomography (APT). This school will focus on the basics of APT for the benefits of young researchers wanting to further their knowledge on the technique. Indeed, the recent improvements in instrumentation technology (laser-pulsing, wide field of view detectors etc) and specimen preparation (site-specific FIB fabrication) have made the technique more readily available to researchers, applicable to a wider range of materials and has raised the interest of many new research teams all over the world.

Program

10h-11h
MK Miller (Oak Ridge Nation Laboratory),
Atom Probe Tomography: Exploring the Nanoworld

11h-11h15 ,
Coffee break

11h15 -12h15
F Vurpillot (University of Rouen),
Basics of the field evaporation theory and to the reconstruction in Atom probe Tomography

12h15-13h30
Lunch break

13h30-14h30
E. Marquis (University of Oxford),
Analysis Tools for Atom Probe Tomography Data , part 1

14h30-15h30
W. Lefebvre (University of Rouen),
Analysis Tools for Atom Probe Tomography Data, part 2

15h30-15h45
Coffee break

15h45-16h45
D. J. Larson (Imago Scientific Instruments),
Applications of the Atom Probe Tomography to microelectronic materials

The school will be designed for scientists, students, or post-doctoral researchers who are new to the field or who want to further their knowledge in the field of atom probe tomography.

Attendance to the school is free for anyone attending the IFES. If you do plan on attending the school, please do not forget to indicate so when registering for the conference.

For any questions regarding this school, feel free to email us at : francois.vurpillot@univ-rouen.fr

 

 

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Pictures of Rouen courtesy of C. Singh